We study material properties in functional materials and devices using various imaging techniques with different scales [from nanometer (nm) to centimeter (cm) scales] such as optical microscopy, scanning electron microscopy, surface profilometer, and scanning probe microscopy (SPM). Among various imaging techniques, we focus nanoscale analysis and control of material properties using SPM. In particular, we study material properties in the applications of information and energy technologies. In addition, we develope advanced SPM techniques to effectively achieve this goal. Furthermore, we apply machine learning algorithms to the SPM data-set. The advanced SPM techniques combined with machine learning algorithms could allow us exploring new material properties at the nanoscale.
