We study material properties in functional materials and devices using various imaging techniques with different scales [from nanometer (nm) to centimeter (cm) scales] such as optical microscopy, scanning electron microscopy, surface profilometer, and scanning probe microscopy (SPM). Among various imaging techniques, we focus nanoscale analysis and control of material properties using SPM. In particular, we have stuided material properties in the applications of information and energy technologies. In addition, we have developed advanced SPM techniques to effectively achieve this goal. The advanced SPM techniques could allow us exploring new material properties at the nanoscale.














The Yunseok Kim Research Group, School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU)

Cheoncheon-dong 300, Jangan-gu, Suwon, Gyeonggi-do 440-746, Republic of Korea, Tel: +82-31-290-7405, E-mail: yunseokkim@skku.edu